DIL 502 Expedis® Serie

Dilatometry (DIL) is a precise analytical technique that measures dimensional changes in materials as a function of temperature and/or time. It provides critical information on key material properties. These measurements are fundamental for both quality assurance and the advancement of materials research.

NanoEye optoelectrical displacement system

In traditional dilatometry, increasing resolution often reduces the measurement range and vice versa. The NanoEye system overcomes this limitation by offering high resolution alongside an unmatched measurement range. It achieves perfect linearity in thermal expansion measurements, surpassing conventional systems.

Functional Principle:

During a test run, if the sample expands, all green components in the graphics move backwards with the help of a linear guide (marked in blue). The optical encoder determines the corresponding length change directly on the appropriate scale.

DIL Funktionsweise

DIL 502 Expedis® Series supports with:

  • Optimization of sintering processes
  • Analyses of temperature-time-length relationships of metals and alloys
  • Material compatibility of composites
  • Optimization of polymer processing
  • Determination of the thermal behavior of refractories

Advantages of the DIL 502 Expedis® Classic:

  • Maximum temperature range from room temperature to 1600 °C
  • Fused silica and/or silicon carbide furnace as single or dual furnace
  • Maximum heating rate of up to 50 K/min
  • Measuring range and solution: ± 5 mm; 2 nm
  • Gas atmosphere: inert, oxidizing under static or dynamic conditions
  • Proteus® software (including device license)

Advantages of the DIL 502 Expedis® Select and Supreme:

  • Maximum temperature range of the Select version: -180 to 2000 °C
  • Maximum temperature range of the Supreme version: -180 to 2800 °C
  • Fused silica, silicon carbide, copper, stainless steel, rhodium and/or graphite furnace as single or dual furnace
  • Maximum heating rate depends on the furnace (at least 50 K/min)
  • Measuring range and resolution of the Select version: ± 10 mm; 1 nm
  • Measuring range and resolution of the Supreme version: ± 25 mm; 0.1 nm
  • Gas atmosphere: inert, oxidizing, reducing, vacuum
  • Proteus® software (including device license)

For further information, please refer to the technical data sheet or the brochure.